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Film thickness measurement

We will provide a detailed explanation of the application information regarding film thickness measurement.

Ocean Optics provides both modular and fully integrated systems for measuring optical and non-optical film thickness characteristics for applications in the semiconductor, industrial, medical, and consumer markets. Customers configure systems to measure the thickness of silicon wafers, determine photoresist layers for masks, and test the hardness and wear of coatings. Components for high-volume OEM applications are also available. These devices cover the vacuum ultraviolet to infrared range and achieve a level of accuracy and reproducibility that makes spectroscopic techniques useful for a wide range of applications. *For more details, please refer to the PDF materials or feel free to contact us.*

  • Spectroscopic Analysis Equipment
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